This is a poster presentation on research-work done at the University Of Oregon in the fields of physical chemistry, and material science thru participation in a program called UCORE. The goal of which is to provide community college students with research experience in the core sciences. The research being presented is work done in the design of a shaped slit for an instrument called a sputter machine, with a special focus on thin films. The shaped slit was designed to decrease the unevenness of thickness in thin films deposited on a silicon wafer. The thin film was composed of tungsten, and titanium, and the thickness of the layers were analyzed by x-ray diffraction by use of a BRUKER D8 discover x-ray diffractometer. This work is completed, and published. The work being presented was conducted in the summer of 2009 by the presenter, who is a current chemistry major at SOU.